Vadošā atomspēku mikroskopa izmantošana nanovadu matricu raksturošanai
Date
2006
Authors
Redkins, Boriss
Journal Title
Journal ISSN
Volume Title
Publisher
Latvijas Universitāte
Abstract
Ultrablīvu nanovadu sistēmu sintēzes realizēšana uz pamatnes virsmas var kalpot kā atslēga nākotnes "botom up" multislāņu ierīču arhitektūru veidošanai. Nanotriboloģiskie pētījumi šādās sistēmās ir svarīgi ne tikai nanoelektromehāniskiem pielietojumiem, bet arī izprastu kontaktparādības heterogenās nanosistēmās.
Ar vadošo atomspēku mikroskopu (ASM) pētīta anodizēta alumīnija oksīda matricā pildītu Ge nanovadu un matricas mijiedarbība ar Pt pārklātu adatas virsmu. Parādīts, ka berzes spēks uz nanovadu virsmu ir lielāks salīdzinājumā ar AAO matricu. Paaugstinot spriegumu starp pamatnes kontaktu un adatu berzes spēki efektīvāk palielinās nanovadu gadījumā. Analizēta adhēzijas un elektrostatisko spēku, strāvas blīvuma, kā arī termisko efektu ietekme uz berzes spēkiem.
The ability to synthesise ultrahigh density arrays of semiconductor wires on-a-chip is the key requirement for the future ‘bottom up’ fabrication of multi-layered device architectures. Investigation of nanotribology of such systems is important for nanoelectromechanical applications as well as for understanding contact phenomena in heterogeneous nanosystems. Force interactions of Ge nanowire arrays encapsulated in oxidized aluminium oxide (AAO) matrix with Pt surface were investigated by conductive atomic force microscope (AFM). Friction force on Ge nanowires was found be higher in comparison to AAO matrix. The friction force increases by applying bias between the bottom electrode and the AFM probe more effective on Ge nanowires in comparison to AAO. Impact of adhesion and electrostatic forces, current density, and thermal effects on friction force are analyzed.
The ability to synthesise ultrahigh density arrays of semiconductor wires on-a-chip is the key requirement for the future ‘bottom up’ fabrication of multi-layered device architectures. Investigation of nanotribology of such systems is important for nanoelectromechanical applications as well as for understanding contact phenomena in heterogeneous nanosystems. Force interactions of Ge nanowire arrays encapsulated in oxidized aluminium oxide (AAO) matrix with Pt surface were investigated by conductive atomic force microscope (AFM). Friction force on Ge nanowires was found be higher in comparison to AAO matrix. The friction force increases by applying bias between the bottom electrode and the AFM probe more effective on Ge nanowires in comparison to AAO. Impact of adhesion and electrostatic forces, current density, and thermal effects on friction force are analyzed.
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Fizika