Thin films stress modeling : a novel approach

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dc.creatorBhattacharyya, A.S
dc.creatorRamgiri, Praveen Kumar
dc.date2015
dc.date.accessioned2016-09-21T12:00:59Z
dc.date.available2016-09-21T12:00:59Z
dc.descriptionA novel approach to estimate the thin film stress was discussed based on surface tension. The effect of temperature and film thickness was studies. The effect of stress on the film mechanical properties was observed.
dc.formatapplication/pdf
dc.identifierhttp://scireprints.lu.lv/290/1/thickness_-residul_stress.pdf
dc.identifierBhattacharyya, A.S and Ramgiri, Praveen Kumar (2015) Thin films stress modeling : a novel approach. (Unpublished)
dc.identifier.urihttps://dspace.lu.lv/dspace/handle/7/34414
dc.relationhttp://scireprints.lu.lv/290/
dc.subjectQ01 Interdisciplinary sciences (General)
dc.titleThin films stress modeling : a novel approach
dc.typeArticle
dc.typeNonPeerReviewed
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